Surface Analysis and nano Imaging Instruments
NEWS
A new tip holder for Force Modulation Microscopy has been acquired for the Dimension 3000 AFM system. This technique allows probing the elastic properties of very localized areas of a sample surface. The technique seems most applicable to biological, polymer, and soft materials, though it limits have not been explored. An application note with further information on this technique is available.
TWO NEW FIELD-EMISSION SEMS HAVE BEEN PURCHASED! A purchase order was issued in mid-September to purchase 2 new field-emission SEMs, one of which will be housed in the Surface Analysis & nano Imaging Lab, and the other of which will be housed in INSCC under the Department of Physics. The Surface Lab will house a FEI Quanta 600 FEG system, which is a high-resolution environmental SEM with EDX capability. Physics will house a FEI Nova Nano, which is a high-vacuum high-resolution imaging SEM. More details and specifications will be posted in the near future. We would like thank the office of the Vice-presidents and the Deans of the Colleges of Engineering, Mines, and Sciences for making this purchase possible.
Also coming soon, as a result of a generous donation by George and Linda Caine, is a microspot XRF and a complementary tool being added on to the ESEM: an EBSD detector for orientation imaging microscopy (OIM).
Surface Analysis & nano Imaging
The Colleges of Science, Engineering, and Mines (Earth Sciences) in conjunction with the the Vice Presidents have collaborated to create a campus- and community-serving "Surface Analysis and nano Imaging" laboratory, with equipment supplied by matched federal grants. In particular, the NSF grant CHE-0443657 to purchase the Kratos XPS system was instrumental in catalyzing this laboratory. Key to this facility is the joint sponsorship of Research Assistant Professor, Dr. Loren Rieth, as University Surface Scientist to provide training and applications support in each of the tools comprising the lab.
Instrumentation
- Kratos AxisUltraDLD (Imaging XPS, Auger, ISS)
- Digital Instruments Dimension 3000 AFM
- Tencor P-10 Stylus profilometer
- Woolam V-Vase spectroscopic ellipsometer
- Polyvar optical microscope with digital imaging with Nomarski
- Zygo 5032 optical (interferometric / non-contact) profilometer
- SNOM scanning nearfield optical microscope. This system will be also be equipped with confocal microscopy and micro Raman spectroscopy. It is located in the Dixon Laser Institute.
Contact Information
- Dr. Brian van Devener
- Research Associate
- Surface Science and nanoImaging Lab
- Lab Number (801) 585-0409
- bvandev at chem dot utah dot edu
- Dr. Loren Rieth
- University Surface Scientist
- Research Assistant Professor
- Electrical and Computer Engineering
- Lab Number (801) 585-0409
- Office Number (801) 585-9535
- rieth at eng dot utah dot edu
- Dr. Ian Harvey
- Associate Director of the Nanofab
- Research Associate Professor
- Office Number (801) 585-6162
- irharvey at eng dot utah dot edu
- Monica Heaton
- Administrative Officer
- Office Number (801) 585-9371
- monica at cs dot utah dot edu
Billing Rates
| Equipment or Service | Internal Users | External Users |
| Equipment time except XPS/SEM | $15/hr (No Cap) | $22.50/hr (No Cap) |
| XPS & ESEM Instrument Time | $45/hr (No Cap) | $67.50/hr (No Cap) |
| Technical Assistance | $55/hr (No Cap) | $82.50/hr (No Cap) |
| Student Assistance | $20/hr (No Cap) | $30/hr (No Cap) |
- General equipment time monitored by time in the lab measured by the card swipe system and instrument usage logs
- Internal Users are for projects that pay University of Utah overhead.
Surface Lab Location
- 1555B Merrill Engineering Builing (MEB)
- This space is North of the Nanofab Lab
- Take the East-West corridor North of the Nanofab Lab